TOKYO — PRI Automation Inc. today announced a new package of advanced process control (APC) software for wafer fabs containing enhancements and specialized modules for lithography, plasma etch, ...

It’s an interesting time in history of advanced process control (APC), a term that encompasses a range of sophisticated software tools and technologies used to optimize plant performance, primarily in ...

Rockwell Automation Pavilion8 Model Predictive Control (MPC) software now empowers engineers to design and execute step tests faster, safer and more accurately. Unlike manual step tests that must be ...

LONDON--(BUSINESS WIRE)--The global advanced process control (APC) software market in the chemical industry to reach USD 367.8 million by 2020, growing at a CAGR of close to 7%, according to Technavio ...

In the manufacturing world, the word “retrofit” many times is feared to mean “lost production.” In other words, plants—or at least parts of plants—must be shut down for equipment to be upgraded. And ...

Aspen Technology's Elinor Price describes how advanced process control modeling and simulation can become part of the modern control room. An upcoming feature article in January, "Changing Workforce ...

Global Advanced Process Control Market is estimated to grow at a substantial CAGR in the forecast period as the scope, product types, and its applications are increasing across the globe. Advanced ...

The Atlas ® G6 system delivers smaller spot size, higher signal sensitivity and enhanced precision for next generation gate-all-around and high bandwidth memory device production The Atlas G6 system ...

Rudolph Technologies announced Wednesday that Tony Mullins will take up the role of director of global process control software sales immediately. Mayson Brooks, Rudolph’s vice president of global ...

Process excursion, or any deviation in a certain process, significantly impacts the cost of semiconductor manufacturing process and product yield. During production, process excursion can be detected ...

Onto Innovation's Atlas G6 optical critical dimension (OCD) metrology system delivers enhanced signal sensitivity, smaller spot size, and advanced precision for process control in next generation gate ...