Electronic Design

ATE – Design for Test – Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Electronic Design

Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...
Semiconductor Engineering

DRAM Test And Inspection Just Gets Tougher

DRAM manufacturers continue to demand cost-effective solutions for screening and process improvement amid growing concerns over defects and process variability, but meeting that demand is becoming ...
Science Daily

Memory self-test via smartphone can identify early signs of Alzheimer's disease

Dedicated memory tests on smartphones enable the detection of 'mild cognitive impairment', a condition that may indicate Alzheimer's disease, with high accuracy. Dedicated memory tests on smartphones ...
Semiconductor Engineering

A Practical Approach To DFT For Large SoCs And AI Architectures, Part I

The traditional processors designed for general-purpose applications struggle to meet the computing demands and power budgets of artificial intelligence (AI) or machine leaning (ML) applications.