Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

Vertical-cavity surface-emitting laser (VCSEL)-based parallel optical interconnects are becoming vital components of communications systems for which short distance (less than 300 meters) and high ...