Like a bad vending machine that takes your money without coughing up the product, a damaged memory card can seemingly eat your data. In some cases, you may be able to stick your hand down the card's ...

Data loss is a common occurrence. According to a study of Backblaze customers, nearly one in two (46%) users experience data loss each year. More specifically, memory card data loss is a common ...

Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...

Three-dimensional (3D) memory integration marks a significant advancement in semiconductor technology, enabling higher device densities and enhanced performance for modern applications. However, the ...

November 9, 2012. Synopsys Inc. has announced a new release of its DesignWare STAR Memory System, an automated pre- and post-silicon memory test, debug, diagnostic and repair solution that enables ...

Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...

When Elon Musk said Tesla cars are computers on wheels, he forgot to mention they run on Linux. They also do a lot of logging. According to Jason Hughes, from 057 Technology, more than they should: ...

In a recent study published in the journal Nature, researchers found that the recruitment of neurons to memory circuits is preceded by a cascade of molecular events induced during learning, which ...