SANTA CLARA, CA--(Marketwired - February 13, 2017) - Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, just announced that Park SmartScan a powerful AFM operating software that ...

The collaboration combines NEC’s industry-leading software with HID’s best-in-class hardware for public safety and beyond This collaboration brings together NEC’s advanced SmartScan™ software and ...