In moving to nanometer process technologies at 130 nm and below, semiconductor designers face a variety of physical and electrical effects that can significantly degrade circuit performance. For these ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

Design technology has traditionally dealt with area, timing and power as its main objectives in the past. While these objectives continue to be essential, the industry is increasingly focusing on a ...