Abstract: This article presents novel approach to achieving record low voltage, large memory window (MW), high speed, and endurance for high-density 1T nonvolatile memory (NVM) with N-type and P-type ...

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Abstract: Reliability analysis for structural systems relies on an accurate surrogate model. Currently, several multiple Kriging methods are utilized to calculate the failure probability. However, ...